For many materials, the truly important is how they perform and behave under the conditions that they are likely to be exposed to during their use-lifetime. This may be the application of stresses and strains in construction materials, the dielectric properties of ceramics or the corrosion resistance of materials as they are exposed to a variety of atmospheric conditions. Using our Cypher and MFP-3D atomic force microscopes () it is possible to measure a huge range of mechanical properties of materials at the nanoscale, from elastic and adhesive forces to materials hardness.
The way a changes structurally under the application of force is vitally important for construction materials. Our Symmetry electron backscatter (EBSD) has market-leading speed and sensitivity allowing the crystalline structure of materials to be characterised quickly. This makes visualisation of the nanoscale structural deformation during in-situ strain and stress testing in the scanning electron microscope a real possibility.